Novel Optical and Laser Physics Paradigms for Extreme Precision Metrology Imaging and Information Processing
DOI:
https://doi.org/10.5281/zenodo.20104767Keywords:
Optical Metrology, Laser Physics, Extreme Precision, Advanced ImagingAbstract
The increasing demand for ultra-high accuracy in measurement, imaging resolution, and information processing has pushed conventional optical and laser technologies toward their fundamental physical limits. Classical optical systems are constrained by diffraction, noise, stability issues, and limited control over light–matter interactions, which restrict their applicability in next-generation precision-driven applications. In response to these challenges, recent advances in optical and laser physics have introduced novel paradigms that enable unprecedented levels of control over optical fields in spatial, temporal, spectral, and quantum domains. This paper presents a comprehensive analytical investigation of emerging optical and laser physics paradigms and examines their potential to enable extreme precision in metrology, advanced imaging, and photonic information processing. By integrating concepts from classical, quantum, nonlinear, and ultrafast optics, the study systematically analyzes the physical mechanisms underlying structured light, coherence engineering, quantum-enhanced measurements, and engineered photonic media. A comparative analytical framework is employed to assess these paradigms in terms of sensitivity, resolution, noise suppression, scalability, and system robustness. The results highlight the transformative role of novel optical strategies in surpassing conventional performance limits and reveal unifying design principles that bridge fundamental physics and practical system implementation. The study concludes that the convergence of advanced laser dynamics and innovative optical architectures offers a viable pathway toward redefining precision standards and enabling next-generation optical technologies for scientific and technological applications.
Downloads
References
1. Born, M., & Wolf, E. (2019). Principles of optics: Electromagnetic theory of propagation, interference and diffraction of light (60th Anniversary ed.). Cambridge University Press.
2. Diels, J.-C., & Arissian, L. (2011). Lasers. Wiley-VCH.
3. Forbes, A., Nothlawala, F., & Vallés, A. (2025). Progress in quantum structured light. Nature Photonics, 19(1291–1300).
4. Fortier, T., & Baumann, E. (2019). 20 years of developments in optical frequency comb technology and applications. arXiv.
5. Guang, Z., Zhu, P., Zhang, F., & Gong, P. (2025). Editorial: Novel optical measurement and imaging technologies using broadband light sources. Frontiers in Physics, 13, 1719821.
6. Hariharan, P. (2003). Optical interferometry (2nd ed.). Academic Press.
7. Hecht, E. (2017). Optics (5th ed.). Pearson.
8. Liang, M., Lu, C., Zhang, M., Lu, D., Gao, Y., Jiang, J., Zheng, Y., Zhang, Y., & Xin, C. (2025). Expansion of metasurface technology: Exploring picophotonics in optical precision metrology. Journal of Beijing Institute of Technology, 34(2), 143–164.
9. Liu, G., & Cen, F. (Eds.). (2022). Advances in precision instruments and optical engineering. Springer Singapore.
10. Orszag, M. (2024). Quantum optics. Springer Nature Switzerland.
11. Paschotta, R. (2024). Encyclopedia of laser physics and technology. Wiley.
12. Prakash, J., Basu, J. K., Mukherjee, S., & Chandrashekar, C. M. (Eds.). (2025). Advances in biophotonics, nanofabrication, optical metrology and nonlinear and ultrafast photonics: Proceedings of PHOTONICS 2023 (Vol. 3). Springer Singapore.
13. Saleh, B. E. A., & Teich, M. C. (2019). Fundamentals of photonics (3rd ed., 2 Vol. set). Wiley.
14. Shan, S., Zhao, F., Li, Z., Luo, L., & Li, X. (2025). A comprehensive review of optical metrology and perception technologies. Sensors, 25(22), 6811.
15. Sun, Y., Wu, J., Tan, M., Xu, X., Li, Y., Morandotti, R., Mitchell, A., & Moss, D. (2023). Applications of integrated optical microcombs. arXiv.
16. Zhang, S. (2025). Advances in laser performance and new principles of precision measuring instruments. Springer Singapore.
17. Zhao, F., Tang, H., Zou, X., & Li, X. (2025). A review of optical metrology techniques for advanced manufacturing applications. Micromachines, 16(11), 1224.
